Scanning electron microscope PHENOM G2 PRO
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Scanning electron microscope PHENOM G2 PRO
Purpose: The microscope is used to solve a large number of various problems in materials science, quality control, research and development, and to train specialists. It can study conductive, non-conductive and damaged samples.
- Obtaining panoramic images, taking measurements on the resulting image, measuring micro- and nanofibers
- Automatic fiber thickness analysis
- Automatic pore measurement
- From 1 to 1000 measurements on one image
- Roughness measurement and obtaining three-dimensional objects
- Automatic roughness measurement Ra and Rz
- Obtaining 2D or 3D images with a height map
- Image processing with filters
- Statistics
- Constructing a profile by height and by plane
Brand/model:
G2 PRO
Manufacturer:
PHENOM